The MP100-MB Thin Film Measurement System comes with a manual microscope is designed to fit your large application needs with an extra big stage that can accommodate glass plates with area sizes as large as 470 by 370 mm.

It also provides state-of-the-art functions to measure such materials as filled cell gap on LCD, polyimide on ITO, color filter CIE chromaticity, and color filter thickness. MP100-MB is also able to measure common materials like Oxide, Nitride, Photoresist and Polysilicon films.

The powerful software algorithms can perform single, double, and triple layer thickness calculations. As well as special search and fit routines that quickly converge the algorithm and variables into an accurate thickness measurement. MP100-MB comes with both Reflection and Transmission mode for Anti-Reflection coating and Transmission measurement.

The MP100-MB uses a compact multiple grating spectrometer to achieve a wide spectrum range from UV to NIR. The unique video display design provides the operator with an ergonomic view of the sample area thus eliminating tedious viewing through conventional microscope optics.
  • Laptop Computer
  • Ocean Optics Spectrometer, Visible to NIR
  • 972RT Metallurgical Microscope
  • Microspot Attachment
  • Height Adjustable Post attached to Base Board
  • Large Surface Area Stage with Low- Friction Teflon Coating
  • Wide Wavelength Range Spectrometer
  • Customized Optical Fiber Cables (including UV-VIS Cables)
  • Desktop (Full Size, Small Form Factor, or All-in-One PC.)
  • Microspot Attachment
  • Ergonomic View Screen Camera
  • Transmission Measurement
  • Great Value
  • Simple Operation
  • Versatile
  • Expandable
  • High Measurement Repeatability
  • Large Surface Area Stage
Scanning Range:
380nm to 950nm

Spectrum Resolution:
2 nm
​
Precision:
0.2 nm
​
Measurement Speed:
2 seconds per Measurement

Measurement Spot Size:
50 Microns at 5X Magnification
25 Microns at 10X Magnification
12 Microns at 20X Magnification
7 Microns at 40X Magnification